Showing results: 211 - 225 of 270 items found.
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TH2811D -
Changzhou Tonghui Electronic Co., Ltd.
TH2810D/TH2811D LCR meter is our newly developed successor instrument for low frequency component measurement. TH2810D/TH2811D with its latest measurement technologies, large character LCD display, surface mount technics, easy of use and excellent appearance can be used for quality control on production line, incoming inspection of components and automatic test system. The RS-232C interface can be used to carry out remote control and statistics and analysis of measurement results.
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TH2810D -
Changzhou Tonghui Electronic Co., Ltd.
TH2810D/TH2811D LCR meter is our newly developed successor instrument for low frequency component measurement. TH2810D/TH2811D with its latest measurement technologies, large character LCD display, surface mount technics, easy of use and excellent appearance can be used for quality control on production line, incoming inspection of components and automatic test system. The RS-232C interface can be used to carry out remote control and statistics and analysis of measurement results.
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EXFO Inc.
In lab and manufacturing environments, R&D engineers require scalable and optimized test solutions to enable them to properly characterize new advanced modulation scheme signals for next-generation, ultra-high-speed telecom networks. Through EXFO’s optical communication analyzers, R&D engineers and manufacturing operations involved in the development or production of transmitters or systems based on new high-speed technology will find the right tools for their advanced technology needs.
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JGB Consulting, Inc.
The Automatic Test Equipment is designed to provide R&D and the Production floor with a high quality, reliable and easy to use Test Station comprised of COTS equipment from industry leading instrument manufactures. The measurement switching has low thermal offset allowing for micro volt measurements. The switching also accommodates both stimulus and measurement up to 5 Amps. Also to provide High Speed and Static Digital Stimulus and Response that covers LVDS, 3.3V, TTL, CMOS and Industrial logic families. For Serial communications there are SPI, I2C, RS232/485, USB and Ethernet. The system has nine programmable DC power supplies that are capable of powering both the UUT and the UUT interface separately. The system can interface with a variety of UUT’s via an ITA. Each system comes with the Imperial Test Executive, National Instruments TestStand, CVI, LabView and .NET Runtime.
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Cincinnati Test Systems
Pressure decay leak testing technology has become a mainstay in the arena of high volume production testing. Pressure decay testing methods offer the world's manufacturers a cost-effective and easily applicable solution to the leak testing challenges they encounter on a given day. Fundamentally, pressure decay testing is a straightforward measurement technique; Cincinnati Test Systems (CTS) pioneers new and innovative ways to integrate our technology into custom turnkey systems that exceed the industry standards for reliability and repeatability. CTS' 30+ years of experience goes way beyond the pressure test unit by offering our customers comprehensive, custom turnkey solutions to the most challenging leak testing problems.
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bsw TestSystems & Consulting AG
Many tasks in the area of semiconductor characterization as well as in the testing of electronic assemblies are routine tasks. Test series of new building elements or samples from production are routinely measured in a large number of electrical parameters. For this, you do not need a measuring device with a complex graphical user interface. A simple interface for remote control with a PC is sufficient. The evaluation and visualization of the results is also carried out on the PC. With the Keysight E5270B and its "little brother" the E5260A two powerful modular SMU units are available for the purpose of the integration into automatic test systems.
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Dayton T. Brown, Inc.
Dayton T. Brown, Inc. can help ensure that your payload is delivered accurately and reliably every time. Our team is responsible for first article, production lot, qualification, and associated testing and engineering support for mechanical and electrical armament and missile launching systems. DTB can help you develop a customized test plan that combines testing across many specifications – environmental, dynamics, EMI/EMC, structural, and non-destructive. Some of the standards that we follow include:
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AEP Technology
AEP Technology offers unique nanomechanical testers with a variety of interchangeable test heads that allow nanoindentation, scratch testing, microindentation testing and abrasion testing to be performed on the same platform. The rugged platform with built-in high-resolution imaging systems (atomic force microscope, 3D profiler, etc.) makes the UNT-30 a powerful tool for R&D and production. In order to ensure the high reliability of the data, the tester is also equipped with a shockproof platform and a soundproof cover.
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Saturn -
Teradyne, Inc.
The Saturn HD is the industry leader in 3.5” Near-Line Hard Disk Drive (HDD) testing. It provides maximum throughput while minimizing factory floor space and power consumption. The system is designed to perform single insertion of SSW, BDSW and Burn-In as well as drive configuration. Using Saturn HD on the production floor will reduce drive build times, enable greater responsiveness to data center demands and lower test costs per HDD unit.
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LBA Group, Inc
LBA's EMFaraCage® faraday cages are EMI and RFI shielding boxes and RF test enclosures that bring convenience to device testing. Faraday cages are ideal for isolating critical systems in high field RF environments or wherever RF ingress or egress must be minimized. Security, production testing, biomedical research and semiconductor testing are only a few of the many areas where EMFaraCage® faraday shielded enclosures are employed. EMFaraCage® faraday cage enclosure systems are fully featured to support a wide variety of test missions. The standard faraday cages include effective power, dataline and RF signal isolation in large test volumes. EMFaraCage® faraday cages are much more affordable than shielded room solutions and offer the convenience of portability.
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JT 2127/Flex Socket Test Module -
JTAG Technologies Inc.
The JT 2127/Flex STM memory socket tester is a family of hardware adapters specifically designed for the testing of of PCB-mounted DIMM & SODIMM sockets using a JTAG/boundary-scan controller and supporting software. The testing of memory sockets has always been troublesome for test and production engineers using JTAG/boundary-scan systems. Even when it is possible to create memory writes/reads from a boundary-scan compliant access device on the UUT (Unit Under Test), the initialization process may fail leaving you with little diagnostics information. What’s more it can still be uncertain whether fault lays with the DIMM module itself or the socket. Using the new JT 2127-Flex system from JTAG Technologies you get pin-point diagnostics from a known-good test interface so you can be certain that your socket is soldered correctly.
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8700 -
Chroma ATE Inc.
Chroma transfers its successful experience in 8000 ATS which is quite well-known in the power electronics industry to the battery application field by developing the Test Items specifically for the battery industry. It can perform automatic tests on the Battery Management System (BMS), semi products and finished products tests on the production line as well as provide long term maintenance and service to the battery module. 8000 (8700) ATS has flexible hardware architecture that can select a variety of hardware devices, such as DC Power Supply, Electronic Load, LCR Meter and 6 1/2 digits Meter, etc. to comply with different automatic testing requirements for various applications. In addition new hardware and test items can be expanded to meet the demands for inspecting the highly customized battery products with diversified tests. The capabilities supported are:
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Signalysis, Inc.
The Dinger is a fast yet sensitive NDT (non-destructive test) system used for batch or 100% inspection of raw or machined metal cast, fabricated, sintered, forged, die cast, or ceramic parts. It’s built on our IQC foundation that’s in daily production use by customers worldwide, and has tested over a million parts. Dinger allows you to dramatically improve the shipped quality, by quickly and reliably identifying parts with either global or local manufacturing defects.
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PT-Series - -
Emite Ingeniería SL. Ed
The PT small-size Reverberation Chamber Series is a one-of-its-own OTA set of test chambers worldwide. With smart-stirring and capable of simultaneously testing up to 8 DUTs of up to 15cm and 5kg, the PT-Series is intended for Production OTA Testing in non-signaling mode, providing unheard-of ultra-fast test times with good accuracy and repeatability and the second smallest footprint on the market, only superseded by our I-Series. TxPower, RSSI and other non-signaling SISO and MIMO test figures of merit for all cellular and wireless technologies, including Main/Diversity/All antenna switching, can be performed in a wide variety of Operating Systems (Windows, Android, iOS, mac OS, Linux, UWP and Tizen).
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17020 -
Chroma ATE Inc.
Chroma's 17020 is a high precision system specifically designed for secondary battery modules and pack tests. Accurate sources and measurements ensure the test quality that is suitable to perform repetitive and reliable tests that are crucial for battery modules / packs, for both incoming or outgoing inspections as well as capacity, performance, production and qualification testing. Chroma's 17020 system architecture offers regenerative discharge designed to recycle the electric energy sourced by the battery module ei ther back to the channel s in the sys tem performing a charging function or to the utility mains in the most energy efficient manner. This feature saves electricity, reduces the facilities thermal foot print and provides a green solution by reducing the environmental impact on our planet. Chroma's 17020 system is equipped with multiple independent channels to support dedicated charge / discharge tests, on multiple battery modules / packs, each with discrete test characteristics. The channels can easily be paralleled to support higher current requirements. This feature provides the ultimate flexibility between high channel count and high current testing.
